TEST_NAME : Wafer
TEST_DATE : 24_09_18-09_55_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-005-006-12 | FUSED_ID : 6359364768403312748
  IC_TEMP :  -57.33 | VDDM : 1099.69 | AUX_INT :  -65.42 | CsaBias :   26.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.86066e-03 / 2
  ADC_P0  : -6.54240e-02 ± 3.27346e-02
  ADC_P1  : 9.25863e-03 ± 7.94649e-04
  ADC_P2  : -8.43686e-06 ± 3.81249e-06
  CSA_Chi2/NDF : 1.56224e-04 / 2
  CSA_P0  : 5.92472e-02 ± 8.33675e-03
  CSA_P1  : 9.85761e-03 ± 6.28114e-04
  CSA_P2  : -4.72389e-05 ± 9.56543e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2453', '1.799', '0.1543', '1.800', '0.0863', '7.000', '0.7077', 1, 1, 1, 1, 1726646136.5289357]
VI_after__Init : ['1.202', '0.2455', '1.800', '0.1544', '1.801', '0.0806', '7.000', '0.7076', 1, 1, 1, 1, 1726646144.5503173]
VI_at__the_End : ['1.202', '0.4885', '1.800', '0.1411', '1.800', '0.1152', '7.000', '0.7083', 1, 1, 1, 1, 1726646205.314522]