TEST_NAME : Wafer
TEST_DATE : 24_09_18-09_39_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-005-016-11 | FUSED_ID : 6359364768403312907
  IC_TEMP :  -57.35 | VDDM : 1124.48 | AUX_INT :   -9.38 | CsaBias :   76.68
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73919e-03 / 2
  ADC_P0  : -9.37535e-03 ± 2.83418e-02
  ADC_P1  : 8.66386e-03 ± 7.23295e-04
  ADC_P2  : -5.82199e-06 ± 3.67331e-06
  CSA_Chi2/NDF : 1.44711e-04 / 2
  CSA_P0  : 6.24485e-02 ± 8.02366e-03
  CSA_P1  : 1.01142e-02 ± 6.04525e-04
  CSA_P2  : -5.06692e-05 ± 9.20620e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [43]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [33]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2875', '1.800', '0.1090', '1.799', '0.0870', '7.000', '0.7070', 1, 1, 1, 1, 1726645159.5553844]
VI_after__Init : ['1.201', '0.2874', '1.800', '0.1091', '1.800', '0.0814', '7.000', '0.7072', 1, 1, 1, 1, 1726645167.5568256]
VI_at__the_End : ['1.202', '0.4920', '1.800', '0.1394', '1.800', '0.1125', '7.000', '0.7079', 1, 1, 1, 1, 1726645225.3412623]