TEST_NAME : Wafer
TEST_DATE : 24_09_18-09_34_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-005-019-11 | FUSED_ID : 6359364768403312955
  IC_TEMP :  -59.29 | VDDM : 1114.94 | AUX_INT :   -9.16 | CsaBias :   78.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50610e-03 / 2
  ADC_P0  : -9.16251e-03 ± 2.62732e-02
  ADC_P1  : 8.08102e-03 ± 6.06913e-04
  ADC_P2  : -6.11657e-06 ± 2.77328e-06
  CSA_Chi2/NDF : 1.02732e-04 / 2
  CSA_P0  : 5.65758e-02 ± 6.76044e-03
  CSA_P1  : 9.07100e-03 ± 5.09350e-04
  CSA_P2  : -3.93047e-05 ± 7.75680e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [40, 59, 106, 114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3825', '1.800', '0.1477', '1.799', '0.0978', '7.000', '0.7070', 1, 1, 1, 1, 1726644865.6721098]
VI_after__Init : ['1.202', '0.3830', '1.800', '0.1478', '1.799', '0.0920', '7.000', '0.7069', 1, 1, 1, 1, 1726644873.6334174]
VI_at__the_End : ['1.202', '0.4669', '1.800', '0.1332', '1.799', '0.1116', '7.000', '0.7077', 1, 1, 1, 1, 1726644933.078882]