TEST_NAME : Wafer
TEST_DATE : 24_09_18-10_36_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-006-025-05 | FUSED_ID : 6359364768403317141
  IC_TEMP :  -58.83 | VDDM : 1124.95 | AUX_INT :   -8.95 | CsaBias :   76.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37018e-03 / 2
  ADC_P0  : -8.94521e-03 ± 2.50710e-02
  ADC_P1  : 8.60868e-03 ± 6.26230e-04
  ADC_P2  : -6.40008e-06 ± 3.10200e-06
  CSA_Chi2/NDF : 1.48258e-04 / 2
  CSA_P0  : 5.73986e-02 ± 8.12142e-03
  CSA_P1  : 9.74112e-03 ± 6.11890e-04
  CSA_P2  : -4.42250e-05 ± 9.31837e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [4]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2610', '1.800', '0.1599', '1.799', '0.0865', '7.000', '0.7079', 1, 1, 1, 1, 1726648578.831914]
VI_after__Init : ['1.202', '0.2610', '1.800', '0.1600', '1.800', '0.0810', '7.000', '0.7078', 1, 1, 1, 1, 1726648586.8292844]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1391', '1.799', '0.1114', '7.000', '0.7086', 1, 1, 1, 1, 1726648646.915774]