TEST_NAME : Wafer
TEST_DATE : 24_09_18-11_12_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-007-006-15 | FUSED_ID : 6359364768403320943
  IC_TEMP :  -56.67 | VDDM : 1126.29 | AUX_INT :   -7.39 | CsaBias :   87.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.51679e-04 / 2
  ADC_P0  : -7.38994e-03 ± 2.08457e-02
  ADC_P1  : 8.65719e-03 ± 5.23425e-04
  ADC_P2  : -6.73759e-06 ± 2.59454e-06
  CSA_Chi2/NDF : 1.39450e-04 / 2
  CSA_P0  : 5.94519e-02 ± 7.87647e-03
  CSA_P1  : 9.73062e-03 ± 5.93435e-04
  CSA_P2  : -4.39995e-05 ± 9.03732e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [14, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [47]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2713', '1.800', '0.1319', '1.800', '0.0885', '7.000', '0.7077', 1, 1, 1, 1, 1726650727.9478798]
VI_after__Init : ['1.202', '0.2715', '1.800', '0.1320', '1.799', '0.0831', '7.000', '0.7078', 1, 1, 1, 1, 1726650735.9291801]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1407', '1.800', '0.1111', '7.000', '0.7084', 1, 1, 1, 1, 1726650793.9746635]