TEST_NAME : Wafer
TEST_DATE : 24_09_18-10_47_44
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-007-021-08 | FUSED_ID : 6359364768403321176
  IC_TEMP :  -50.72 | VDDM : 1132.32 | AUX_INT :   -9.01 | CsaBias :   81.39
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45128e-03 / 2
  ADC_P0  : -9.00552e-03 ± 2.58502e-02
  ADC_P1  : 8.27605e-03 ± 6.30452e-04
  ADC_P2  : -5.33594e-06 ± 3.05825e-06
  CSA_Chi2/NDF : 1.06343e-04 / 2
  CSA_P0  : 5.82906e-02 ± 6.87824e-03
  CSA_P1  : 9.59988e-03 ± 5.18226e-04
  CSA_P2  : -4.20142e-05 ± 7.89197e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2662', '1.800', '0.1652', '1.800', '0.0832', '7.000', '0.7082', 1, 1, 1, 1, 1726649263.9473445]
VI_after__Init : ['1.202', '0.2662', '1.800', '0.1652', '1.800', '0.0777', '7.000', '0.7081', 1, 1, 1, 1, 1726649271.9747436]
VI_at__the_End : ['1.201', '0.4931', '1.800', '0.1369', '1.800', '0.1115', '7.000', '0.7086', 1, 1, 1, 1, 1726649331.3993442]