TEST_NAME : Wafer
TEST_DATE : 24_09_18-10_39_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-007-026-08 | FUSED_ID : 6359364768403321256
  IC_TEMP :  -52.26 | VDDM : 1125.31 | AUX_INT :  -26.30 | CsaBias :   55.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23385e-03 / 2
  ADC_P0  : -2.62993e-02 ± 2.47083e-02
  ADC_P1  : 9.11346e-03 ± 6.37984e-04
  ADC_P2  : -7.41410e-06 ± 3.24907e-06
  CSA_Chi2/NDF : 1.31366e-04 / 2
  CSA_P0  : 5.77173e-02 ± 7.64476e-03
  CSA_P1  : 9.63241e-03 ± 5.75977e-04
  CSA_P2  : -4.27168e-05 ± 8.77145e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [8, 11, 13, 19]
 | N_BROKEN_SLOW :  [17]
   P_BROKEN_DISC :  19
 | P_BROKEN_FAST :  [8, 11, 13, 15, 16, 17, 18, 19, 20, 21, 23, 116]
 | P_BROKEN_SLOW :  [3, 4, 5, 7, 16, 21, 23]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1838', '1.800', '0.1418', '1.800', '0.0795', '7.000', '0.7079', 1, 1, 1, 1, 1726648773.6783133]
VI_after__Init : ['1.202', '0.1838', '1.800', '0.1417', '1.801', '0.0740', '7.000', '0.7079', 1, 1, 1, 1, 1726648781.6836946]
VI_at__the_End : ['1.201', '0.4893', '1.800', '0.1384', '1.800', '0.1100', '7.000', '0.7085', 1, 1, 1, 1, 1726648841.690214]