TEST_NAME : Wafer
TEST_DATE : 24_09_18-11_18_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-008-002-11 | FUSED_ID : 6359364768403324971
  IC_TEMP :  -62.39 | VDDM : 1127.29 | AUX_INT :   -6.65 | CsaBias :   70.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.98489e-04 / 2
  ADC_P0  : -6.65150e-03 ± 2.13555e-02
  ADC_P1  : 8.64254e-03 ± 5.35684e-04
  ADC_P2  : -6.92733e-06 ± 2.63781e-06
  CSA_Chi2/NDF : 7.68987e-05 / 2
  CSA_P0  : 5.65086e-02 ± 5.84900e-03
  CSA_P1  : 8.93898e-03 ± 4.40680e-04
  CSA_P2  : -3.60573e-05 ± 6.71104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [45]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1515', '1.800', '0.1597', '1.800', '0.0828', '7.000', '0.7083', 1, 1, 1, 1, 1726651117.634459]
VI_after__Init : ['1.202', '0.1515', '1.800', '0.1597', '1.800', '0.0761', '7.000', '0.7076', 1, 1, 1, 1, 1726651125.564811]
VI_at__the_End : ['1.202', '0.4735', '1.800', '0.1384', '1.800', '0.1143', '7.000', '0.7082', 1, 1, 1, 1, 1726651183.2173226]