TEST_NAME : Wafer
TEST_DATE : 24_09_18-11_25_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-008-006-11 | FUSED_ID : 6359364768403325035
  IC_TEMP :  -58.85 | VDDM : 1132.19 | AUX_INT :   -8.86 | CsaBias :   75.12
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30442e-03 / 2
  ADC_P0  : -8.85965e-03 ± 2.44536e-02
  ADC_P1  : 8.46071e-03 ± 5.98257e-04
  ADC_P2  : -6.27496e-06 ± 2.90379e-06
  CSA_Chi2/NDF : 1.41897e-04 / 2
  CSA_P0  : 6.04263e-02 ± 7.94528e-03
  CSA_P1  : 9.74388e-03 ± 5.98620e-04
  CSA_P2  : -4.41689e-05 ± 9.11627e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [57, 77]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [3]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3495', '1.800', '0.1584', '1.799', '0.0982', '7.000', '0.7080', 1, 1, 1, 1, 1726651507.475209]
VI_after__Init : ['1.202', '0.3496', '1.800', '0.1585', '1.800', '0.0908', '7.000', '0.7070', 1, 1, 1, 1, 1726651516.1134717]
VI_at__the_End : ['1.202', '0.4964', '1.800', '0.1420', '1.802', '0.1124', '7.000', '0.7079', 1, 1, 1, 1, 1726651574.1080089]