TEST_NAME : Wafer
TEST_DATE : 24_09_18-11_44_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-008-018-12 | FUSED_ID : 6359364768403325228
  IC_TEMP :  -55.90 | VDDM : 1123.66 | AUX_INT :   -8.59 | CsaBias :   74.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13827e-03 / 2
  ADC_P0  : -8.58503e-03 ± 2.28085e-02
  ADC_P1  : 8.40498e-03 ± 5.53116e-04
  ADC_P2  : -6.28941e-06 ± 2.65994e-06
  CSA_Chi2/NDF : 1.28365e-04 / 2
  CSA_P0  : 5.97666e-02 ± 7.55694e-03
  CSA_P1  : 9.80689e-03 ± 5.69361e-04
  CSA_P2  : -4.60385e-05 ± 8.67069e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [54]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3003', '1.800', '0.1647', '1.800', '0.0944', '7.000', '0.7073', 1, 1, 1, 1, 1726652676.4295638]
VI_after__Init : ['1.201', '0.3005', '1.800', '0.1647', '1.800', '0.0894', '7.000', '0.7076', 1, 1, 1, 1, 1726652684.479039]
VI_at__the_End : ['1.201', '0.4908', '1.800', '0.1393', '1.804', '0.1146', '7.000', '0.7084', 1, 1, 1, 1, 1726652743.3135912]