TEST_NAME : Wafer
TEST_DATE : 24_09_18-11_54_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-008-024-12 | FUSED_ID : 6359364768403325324
  IC_TEMP :  -52.87 | VDDM : 1120.32 | AUX_INT :   -9.25 | CsaBias :   87.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.64479e-03 / 2
  ADC_P0  : -9.25193e-03 ± 2.75495e-02
  ADC_P1  : 8.15723e-03 ± 6.64126e-04
  ADC_P2  : -5.06166e-06 ± 3.18708e-06
  CSA_Chi2/NDF : 1.25637e-04 / 2
  CSA_P0  : 5.90437e-02 ± 7.47620e-03
  CSA_P1  : 9.66942e-03 ± 5.63278e-04
  CSA_P2  : -4.27322e-05 ± 8.57805e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3286', '1.800', '0.1613', '1.799', '0.0962', '7.000', '0.7076', 1, 1, 1, 1, 1726653262.568826]
VI_after__Init : ['1.202', '0.3287', '1.800', '0.1613', '1.800', '0.0914', '7.000', '0.7076', 1, 1, 1, 1, 1726653270.605248]
VI_at__the_End : ['1.202', '0.4948', '1.800', '0.1353', '1.801', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1726653331.0068681]