TEST_NAME : Wafer
TEST_DATE : 24_09_18-11_56_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-008-025-12 | FUSED_ID : 6359364768403325340
  IC_TEMP :  -53.60 | VDDM : 1121.91 | AUX_INT :  -17.17 | CsaBias :   73.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48316e-03 / 2
  ADC_P0  : -1.71739e-02 ± 2.65941e-02
  ADC_P1  : 8.30207e-03 ± 6.41006e-04
  ADC_P2  : -5.60168e-06 ± 3.06369e-06
  CSA_Chi2/NDF : 1.25430e-04 / 2
  CSA_P0  : 5.76743e-02 ± 7.47003e-03
  CSA_P1  : 9.60719e-03 ± 5.62813e-04
  CSA_P2  : -4.28592e-05 ± 8.57097e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [53, 64, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3439', '1.800', '0.1516', '1.800', '0.0912', '7.000', '0.7076', 1, 1, 1, 1, 1726653360.4685457]
VI_after__Init : ['1.202', '0.3440', '1.800', '0.1516', '1.800', '0.0854', '7.000', '0.7077', 1, 1, 1, 1, 1726653368.6849723]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1364', '1.800', '0.1106', '7.000', '0.7084', 1, 1, 1, 1, 1726653428.3534887]