TEST_NAME : Wafer
TEST_DATE : 24_09_18-12_41_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-009-002-06 | FUSED_ID : 6359364768403329062
  IC_TEMP :  -61.32 | VDDM : 1119.95 | AUX_INT : -100.43 | CsaBias :    1.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.22019e-03 / 2
  ADC_P0  : -1.00433e-01 ± 2.81115e-02
  ADC_P1  : 1.02802e-02 ± 6.93120e-04
  ADC_P2  : -1.22101e-05 ± 3.35625e-06
  CSA_Chi2/NDF : 1.55107e-04 / 2
  CSA_P0  : 6.07919e-02 ± 8.30688e-03
  CSA_P1  : 1.02588e-02 ± 6.25864e-04
  CSA_P2  : -4.91606e-05 ± 9.53116e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [1]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2795', '1.800', '0.1725', '1.800', '0.0895', '7.000', '0.7073', 1, 1, 1, 1, 1726656090.415744]
VI_after__Init : ['1.202', '0.2797', '1.800', '0.1723', '1.799', '0.0840', '7.000', '0.7069', 1, 1, 1, 1, 1726656098.4122372]
VI_at__the_End : ['1.201', '0.5077', '1.800', '0.1436', '1.804', '0.1121', '7.000', '0.7078', 1, 1, 1, 1, 1726656158.4875154]