TEST_NAME : Wafer
TEST_DATE : 24_09_18-12_38_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-009-004-06 | FUSED_ID : 6359364768403329094
  IC_TEMP :  -57.55 | VDDM : 1124.68 | AUX_INT :   -7.80 | CsaBias :   83.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27885e-03 / 2
  ADC_P0  : -7.80128e-03 ± 2.42421e-02
  ADC_P1  : 8.37527e-03 ± 5.97565e-04
  ADC_P2  : -5.79719e-06 ± 2.91121e-06
  CSA_Chi2/NDF : 1.06117e-04 / 2
  CSA_P0  : 6.03981e-02 ± 6.87093e-03
  CSA_P1  : 9.44276e-03 ± 5.17675e-04
  CSA_P2  : -3.92281e-05 ± 7.88358e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [67]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [66, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3142', '1.800', '0.1748', '1.800', '0.0925', '7.000', '0.7072', 1, 1, 1, 1, 1726655894.8191128]
VI_after__Init : ['1.202', '0.3145', '1.800', '0.1749', '1.800', '0.0866', '7.000', '0.7072', 1, 1, 1, 1, 1726655902.8345206]
VI_at__the_End : ['1.201', '0.4948', '1.800', '0.1377', '1.800', '0.1111', '7.000', '0.7080', 1, 1, 1, 1, 1726655959.554965]