TEST_NAME : Wafer
TEST_DATE : 24_09_18-12_36_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-009-005-06 | FUSED_ID : 6359364768403329110
  IC_TEMP :  -58.74 | VDDM : 1122.72 | AUX_INT :   -7.27 | CsaBias :   77.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08642e-03 / 2
  ADC_P0  : -7.27100e-03 ± 2.23176e-02
  ADC_P1  : 8.48826e-03 ± 5.56728e-04
  ADC_P2  : -6.06999e-06 ± 2.74217e-06
  CSA_Chi2/NDF : 1.19603e-04 / 2
  CSA_P0  : 6.12197e-02 ± 7.29447e-03
  CSA_P1  : 9.63322e-03 ± 5.49586e-04
  CSA_P2  : -4.28811e-05 ± 8.36954e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3184', '1.800', '0.1650', '1.800', '0.0915', '7.000', '0.7076', 1, 1, 1, 1, 1726655797.5545363]
VI_after__Init : ['1.201', '0.3183', '1.800', '0.1650', '1.800', '0.0854', '7.000', '0.7076', 1, 1, 1, 1, 1726655805.5438404]
VI_at__the_End : ['1.202', '0.4941', '1.800', '0.1416', '1.803', '0.1141', '7.000', '0.7083', 1, 1, 1, 1, 1726655863.2534807]