TEST_NAME : Wafer
TEST_DATE : 24_09_18-12_13_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-009-019-01 | FUSED_ID : 6359364768403329329
  IC_TEMP :  -60.58 | VDDM : 1116.56 | AUX_INT :   -5.55 | CsaBias :   71.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.80329e-04 / 2
  ADC_P0  : -5.55180e-03 ± 1.88549e-02
  ADC_P1  : 8.57550e-03 ± 4.70257e-04
  ADC_P2  : -6.71402e-06 ± 2.30705e-06
  CSA_Chi2/NDF : 1.47442e-04 / 2
  CSA_P0  : 6.08908e-02 ± 8.09903e-03
  CSA_P1  : 1.00240e-02 ± 6.10203e-04
  CSA_P2  : -4.76600e-05 ± 9.29267e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [101, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [54, 98, 108, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2250', '1.800', '0.1844', '1.800', '0.0861', '7.000', '0.7079', 1, 1, 1, 1, 1726654432.5269485]
VI_after__Init : ['1.202', '0.2250', '1.800', '0.1844', '1.800', '0.0807', '7.000', '0.7078', 1, 1, 1, 1, 1726654440.7233367]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1396', '1.802', '0.1137', '7.000', '0.7087', 1, 1, 1, 1, 1726654502.2854836]