TEST_NAME : Wafer
TEST_DATE : 24_09_18-12_48_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-010-005-08 | FUSED_ID : 6359364768403333208
  IC_TEMP :  -58.53 | VDDM : 1124.07 | AUX_INT :   -7.66 | CsaBias :   73.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05723e-03 / 2
  ADC_P0  : -7.66204e-03 ± 2.20010e-02
  ADC_P1  : 8.19823e-03 ± 5.26780e-04
  ADC_P2  : -5.78537e-06 ± 2.49293e-06
  CSA_Chi2/NDF : 1.06143e-04 / 2
  CSA_P0  : 5.88887e-02 ± 6.87177e-03
  CSA_P1  : 9.44871e-03 ± 5.17739e-04
  CSA_P2  : -4.07240e-05 ± 7.88455e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2646', '1.800', '0.1801', '1.799', '0.0950', '7.000', '0.7070', 1, 1, 1, 1, 1726656480.0326996]
VI_after__Init : ['1.201', '0.2646', '1.800', '0.1803', '1.800', '0.0894', '7.000', '0.7072', 1, 1, 1, 1, 1726656488.0631208]
VI_at__the_End : ['1.202', '0.4889', '1.800', '0.1401', '1.800', '0.1140', '7.000', '0.7076', 1, 1, 1, 1, 1726656546.4105885]