TEST_NAME : Wafer
TEST_DATE : 24_09_18-12_57_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-010-011-08 | FUSED_ID : 6359364768403333304
  IC_TEMP :  -54.86 | VDDM : 1131.98 | AUX_INT :   -7.11 | CsaBias :   89.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01190e-03 / 2
  ADC_P0  : -7.11318e-03 ± 2.15402e-02
  ADC_P1  : 8.15389e-03 ± 5.18464e-04
  ADC_P2  : -5.46168e-06 ± 2.46468e-06
  CSA_Chi2/NDF : 9.91337e-05 / 2
  CSA_P0  : 5.92001e-02 ± 6.64099e-03
  CSA_P1  : 9.85642e-03 ± 5.00351e-04
  CSA_P2  : -4.44818e-05 ± 7.61975e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [31]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3907', '1.800', '0.1664', '1.800', '0.0996', '7.000', '0.7085', 1, 1, 1, 1, 1726657066.098758]
VI_after__Init : ['1.202', '0.3911', '1.800', '0.1665', '1.800', '0.0926', '7.000', '0.7075', 1, 1, 1, 1, 1726657073.424189]
VI_at__the_End : ['1.202', '0.4994', '1.800', '0.1429', '1.799', '0.1114', '7.000', '0.7083', 1, 1, 1, 1, 1726657132.456648]