TEST_NAME : Wafer
TEST_DATE : 24_09_18-13_49_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-011-012-05 | FUSED_ID : 6359364768403337413
  IC_TEMP :  -57.55 | VDDM : 1124.68 | AUX_INT :   -7.80 | CsaBias :   83.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27885e-03 / 2
  ADC_P0  : -7.80128e-03 ± 2.42421e-02
  ADC_P1  : 8.37527e-03 ± 5.97565e-04
  ADC_P2  : -5.79719e-06 ± 2.91121e-06
  CSA_Chi2/NDF : 1.19639e-04 / 2
  CSA_P0  : 6.04973e-02 ± 7.29557e-03
  CSA_P1  : 9.92204e-03 ± 5.49669e-04
  CSA_P2  : -4.70001e-05 ± 8.37081e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [15, 88, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.1373', '1.800', '0.1470', '1.800', '0.0843', '7.000', '0.7079', 1, 1, 1, 1, 1726660187.484454]
VI_after__Init : ['1.202', '0.1373', '1.800', '0.1468', '1.800', '0.0794', '7.000', '0.7079', 1, 1, 1, 1, 1726660195.5299222]
VI_at__the_End : ['1.202', '0.4958', '1.800', '0.1391', '1.803', '0.1130', '7.000', '0.7083', 1, 1, 1, 1, 1726660254.3925474]