TEST_NAME : Wafer
TEST_DATE : 24_09_18-13_46_32
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-011-014-05 | FUSED_ID : 6359364768403337445
  IC_TEMP :  -59.76 | VDDM : 1122.20 | AUX_INT :   -8.88 | CsaBias :   76.51
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29904e-03 / 2
  ADC_P0  : -8.88321e-03 ± 2.44193e-02
  ADC_P1  : 8.60075e-03 ± 6.11948e-04
  ADC_P2  : -6.16514e-06 ± 3.04859e-06
  CSA_Chi2/NDF : 1.16529e-04 / 2
  CSA_P0  : 5.89929e-02 ± 7.20010e-03
  CSA_P1  : 9.93192e-03 ± 5.42476e-04
  CSA_P2  : -4.81981e-05 ± 8.26126e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [117]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [72]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3480', '1.800', '0.1760', '1.799', '0.0942', '7.000', '0.7087', 1, 1, 1, 1, 1726659992.0236537]
VI_after__Init : ['1.202', '0.3482', '1.800', '0.1760', '1.800', '0.0867', '7.000', '0.7080', 1, 1, 1, 1, 1726660000.0631657]
VI_at__the_End : ['1.202', '0.4895', '1.800', '0.1415', '1.799', '0.1137', '7.000', '0.7086', 1, 1, 1, 1, 1726660059.1978374]