TEST_NAME : Wafer
TEST_DATE : 24_09_18-13_40_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-011-018-02 | FUSED_ID : 6359364768403337506
  IC_TEMP :  -57.72 | VDDM : 1108.96 | AUX_INT :   -7.57 | CsaBias :   84.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13821e-03 / 2
  ADC_P0  : -7.56716e-03 ± 2.28041e-02
  ADC_P1  : 8.41827e-03 ± 5.50801e-04
  ADC_P2  : -6.78202e-06 ± 2.61773e-06
  CSA_Chi2/NDF : 8.38616e-05 / 2
  CSA_P0  : 5.90021e-02 ± 6.10807e-03
  CSA_P1  : 9.28089e-03 ± 4.60199e-04
  CSA_P2  : -3.91728e-05 ± 7.00828e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [28]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3206', '1.800', '0.1442', '1.800', '0.0873', '7.000', '0.7078', 1, 1, 1, 1, 1726659601.9911373]
VI_after__Init : ['1.202', '0.3207', '1.800', '0.1441', '1.800', '0.0818', '7.000', '0.7081', 1, 1, 1, 1, 1726659610.1024606]
VI_at__the_End : ['1.202', '0.4858', '1.800', '0.1363', '1.804', '0.1118', '7.000', '0.7086', 1, 1, 1, 1, 1726659669.2528782]