TEST_NAME : Wafer
TEST_DATE : 24_09_18-13_36_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-011-020-02 | FUSED_ID : 6359364768403337538
  IC_TEMP :  -53.62 | VDDM : 1101.94 | AUX_INT :   -9.53 | CsaBias :   75.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.60724e-03 / 2
  ADC_P0  : -9.53488e-03 ± 2.71562e-02
  ADC_P1  : 8.55249e-03 ± 6.64596e-04
  ADC_P2  : -6.74437e-06 ± 3.22275e-06
  CSA_Chi2/NDF : 9.11688e-05 / 2
  CSA_P0  : 6.09756e-02 ± 6.36862e-03
  CSA_P1  : 9.64126e-03 ± 4.79830e-04
  CSA_P2  : -4.18295e-05 ± 7.30724e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [73]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3631', '1.800', '0.1431', '1.800', '0.0919', '7.000', '0.7081', 1, 1, 1, 1, 1726659406.7954614]
VI_after__Init : ['1.202', '0.3631', '1.800', '0.1430', '1.800', '0.0863', '7.000', '0.7082', 1, 1, 1, 1, 1726659414.784873]
VI_at__the_End : ['1.202', '0.4990', '1.800', '0.1410', '1.800', '0.1107', '7.000', '0.7087', 1, 1, 1, 1, 1726659470.191427]