TEST_NAME : Wafer
TEST_DATE : 24_09_18-14_30_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-012-016-10 | FUSED_ID : 6359364768403341578
  IC_TEMP :  -51.02 | VDDM : 1125.97 | AUX_INT :   -7.25 | CsaBias :   85.57
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.13488e-03 / 2
  ADC_P0  : -7.24820e-03 ± 2.28028e-02
  ADC_P1  : 8.50805e-03 ± 5.66984e-04
  ADC_P2  : -6.35497e-06 ± 2.77697e-06
  CSA_Chi2/NDF : 9.48628e-05 / 2
  CSA_P0  : 5.70072e-02 ± 6.49636e-03
  CSA_P1  : 9.69222e-03 ± 4.89454e-04
  CSA_P2  : -4.18243e-05 ± 7.45381e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4387', '1.800', '0.1525', '1.799', '0.0929', '7.000', '0.7079', 1, 1, 1, 1, 1726662626.8414063]
VI_after__Init : ['1.202', '0.4389', '1.800', '0.1524', '1.801', '0.0877', '7.000', '0.7078', 1, 1, 1, 1, 1726662634.884848]
VI_at__the_End : ['1.201', '0.4991', '1.800', '0.1393', '1.804', '0.1112', '7.000', '0.7084', 1, 1, 1, 1, 1726662689.3346882]