TEST_NAME : Wafer
TEST_DATE : 24_09_18-14_45_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-012-025-10 | FUSED_ID : 6359364768403341722
  IC_TEMP :  -53.53 | VDDM : 1135.32 | AUX_INT :   -9.00 | CsaBias :   96.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46392e-03 / 2
  ADC_P0  : -9.00079e-03 ± 2.59454e-02
  ADC_P1  : 8.14830e-03 ± 6.18132e-04
  ADC_P2  : -5.47530e-06 ± 2.92339e-06
  CSA_Chi2/NDF : 9.63792e-05 / 2
  CSA_P0  : 5.79566e-02 ± 6.54808e-03
  CSA_P1  : 9.32627e-03 ± 4.93351e-04
  CSA_P2  : -3.48019e-05 ± 7.51315e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [28]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4553', '1.800', '0.1459', '1.800', '0.0957', '7.000', '0.7076', 1, 1, 1, 1, 1726663505.3767803]
VI_after__Init : ['1.202', '0.4555', '1.800', '0.1460', '1.800', '0.0900', '7.000', '0.7078', 1, 1, 1, 1, 1726663513.4481997]
VI_at__the_End : ['1.202', '0.5018', '1.800', '0.1387', '1.803', '0.1097', '7.000', '0.7086', 1, 1, 1, 1, 1726663573.6405535]