TEST_NAME : Wafer
TEST_DATE : 24_09_18-15_12_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-013-012-00 | FUSED_ID : 6359364768403345600
  IC_TEMP :  -55.48 | VDDM : 1124.55 | AUX_INT :   -8.76 | CsaBias :   81.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26340e-03 / 2
  ADC_P0  : -8.76326e-03 ± 2.40832e-02
  ADC_P1  : 8.24736e-03 ± 5.82247e-04
  ADC_P2  : -5.49091e-06 ± 2.79844e-06
  CSA_Chi2/NDF : 1.21335e-04 / 2
  CSA_P0  : 6.13365e-02 ± 7.34708e-03
  CSA_P1  : 9.77813e-03 ± 5.53549e-04
  CSA_P2  : -4.49232e-05 ± 8.42990e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [64, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3215', '1.799', '0.1724', '1.799', '0.0955', '7.000', '0.7069', 1, 1, 1, 1, 1726665166.4917321]
VI_after__Init : ['1.201', '0.3217', '1.800', '0.1724', '1.800', '0.0900', '7.000', '0.7067', 1, 1, 1, 1, 1726665174.5181031]
VI_at__the_End : ['1.202', '0.4952', '1.800', '0.1401', '1.799', '0.1143', '7.000', '0.7073', 1, 1, 1, 1, 1726665232.2237215]