TEST_NAME : Wafer
TEST_DATE : 24_09_18-14_58_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-013-021-07 | FUSED_ID : 6359364768403345751
  IC_TEMP :  -50.18 | VDDM : 1127.08 | AUX_INT :   -7.53 | CsaBias :   88.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19256e-03 / 2
  ADC_P0  : -7.52804e-03 ± 2.34106e-02
  ADC_P1  : 8.04496e-03 ± 5.57029e-04
  ADC_P2  : -5.21127e-06 ± 2.62013e-06
  CSA_Chi2/NDF : 7.64987e-05 / 2
  CSA_P0  : 5.90870e-02 ± 5.83377e-03
  CSA_P1  : 9.15595e-03 ± 4.39533e-04
  CSA_P2  : -3.37920e-05 ± 6.69356e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [1, 52]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3222', '1.800', '0.1813', '1.799', '0.0938', '7.000', '0.7076', 1, 1, 1, 1, 1726664287.3639562]
VI_after__Init : ['1.201', '0.3223', '1.800', '0.1809', '1.800', '0.0886', '7.000', '0.7077', 1, 1, 1, 1, 1726664295.3153586]
VI_at__the_End : ['1.201', '0.4987', '1.800', '0.1390', '1.804', '0.1109', '7.000', '0.7082', 1, 1, 1, 1, 1726664354.006885]