TEST_NAME : Wafer
TEST_DATE : 24_09_18-14_54_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-013-023-07 | FUSED_ID : 6359364768403345783
  IC_TEMP :  -57.06 | VDDM : 1125.46 | AUX_INT :   -9.61 | CsaBias :   89.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68485e-03 / 2
  ADC_P0  : -9.61263e-03 ± 2.78733e-02
  ADC_P1  : 8.35917e-03 ± 6.82129e-04
  ADC_P2  : -5.57699e-06 ± 3.32432e-06
  CSA_Chi2/NDF : 1.35623e-04 / 2
  CSA_P0  : 5.86840e-02 ± 7.76763e-03
  CSA_P1  : 1.00247e-02 ± 5.85235e-04
  CSA_P2  : -4.66502e-05 ± 8.91244e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [17]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2661', '1.800', '0.1722', '1.799', '0.0927', '7.000', '0.7076', 1, 1, 1, 1, 1726664091.2460196]
VI_after__Init : ['1.202', '0.2663', '1.800', '0.1718', '1.800', '0.0872', '7.000', '0.7077', 1, 1, 1, 1, 1726664099.3303783]
VI_at__the_End : ['1.202', '0.5020', '1.800', '0.1396', '1.802', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1726664158.4559298]