TEST_NAME : Wafer
TEST_DATE : 24_09_18-14_53_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-013-024-07 | FUSED_ID : 6359364768403345799
  IC_TEMP :  -52.30 | VDDM : 1127.30 | AUX_INT :   -7.65 | CsaBias :   83.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03836e-03 / 2
  ADC_P0  : -7.65122e-03 ± 2.18176e-02
  ADC_P1  : 8.32882e-03 ± 5.34823e-04
  ADC_P2  : -5.67125e-06 ± 2.59601e-06
  CSA_Chi2/NDF : 9.67289e-05 / 2
  CSA_P0  : 5.85877e-02 ± 6.55995e-03
  CSA_P1  : 9.80549e-03 ± 4.94245e-04
  CSA_P2  : -4.16936e-05 ± 7.52676e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [83]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1873', '1.800', '0.1651', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1726663994.0804656]
VI_after__Init : ['1.202', '0.1873', '1.800', '0.1651', '1.801', '0.0817', '7.000', '0.7080', 1, 1, 1, 1, 1726664002.1078908]
VI_at__the_End : ['1.202', '0.5074', '1.800', '0.1398', '1.799', '0.1100', '7.000', '0.7084', 1, 1, 1, 1, 1726664064.392174]