TEST_NAME : Wafer
TEST_DATE : 24_09_18-15_55_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-014-019-09 | FUSED_ID : 6359364768403349817
  IC_TEMP :  -53.41 | VDDM : 1123.14 | AUX_INT :   -8.16 | CsaBias :   91.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05073e-03 / 2
  ADC_P0  : -8.15659e-03 ± 2.19375e-02
  ADC_P1  : 8.36871e-03 ± 5.36589e-04
  ADC_P2  : -5.80580e-06 ± 2.60696e-06
  CSA_Chi2/NDF : 8.64560e-05 / 2
  CSA_P0  : 5.87460e-02 ± 6.20183e-03
  CSA_P1  : 9.59408e-03 ± 4.67263e-04
  CSA_P2  : -4.08433e-05 ± 7.11586e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [31, 53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [85, 89, 92, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1705', '1.800', '0.1415', '1.800', '0.0824', '7.000', '0.7086', 1, 1, 1, 1, 1726667705.3345957]
VI_after__Init : ['1.201', '0.1705', '1.800', '0.1415', '1.801', '0.0751', '7.000', '0.7081', 1, 1, 1, 1, 1726667713.4108775]
VI_at__the_End : ['1.201', '0.4968', '1.800', '0.1406', '1.800', '0.1111', '7.000', '0.7088', 1, 1, 1, 1, 1726667773.0073688]