TEST_NAME : Wafer
TEST_DATE : 24_09_18-15_59_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-014-022-09 | FUSED_ID : 6359364768403349865
  IC_TEMP :  -50.90 | VDDM : 1123.68 | AUX_INT :   -7.19 | CsaBias :   82.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.11720e-03 / 2
  ADC_P0  : -7.18773e-03 ± 2.26737e-02
  ADC_P1  : 8.16967e-03 ± 5.52261e-04
  ADC_P2  : -5.08725e-06 ± 2.66402e-06
  CSA_Chi2/NDF : 7.90867e-05 / 2
  CSA_P0  : 5.97804e-02 ± 5.93163e-03
  CSA_P1  : 9.60199e-03 ± 4.46905e-04
  CSA_P2  : -3.98276e-05 ± 6.80584e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4652', '1.800', '0.1191', '1.799', '0.0950', '7.000', '0.7079', 1, 1, 1, 1, 1726667999.5501006]
VI_after__Init : ['1.202', '0.4656', '1.800', '0.1191', '1.800', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1726668007.6275086]
VI_at__the_End : ['1.202', '0.5045', '1.800', '0.1384', '1.804', '0.1098', '7.000', '0.7086', 1, 1, 1, 1, 1726668067.643907]