TEST_NAME : Wafer
TEST_DATE : 24_09_18-16_01_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-014-023-09 | FUSED_ID : 6359364768403349881
  IC_TEMP :  -52.39 | VDDM : 1130.79 | AUX_INT :   -8.34 | CsaBias :   77.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.59890e-03 / 2
  ADC_P0  : -8.33866e-03 ± 2.71348e-02
  ADC_P1  : 7.89451e-03 ± 6.26776e-04
  ADC_P2  : -5.08812e-06 ± 2.87749e-06
  CSA_Chi2/NDF : 8.28592e-05 / 2
  CSA_P0  : 5.68415e-02 ± 6.07145e-03
  CSA_P1  : 9.56143e-03 ± 4.57440e-04
  CSA_P2  : -3.93056e-05 ± 6.96627e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [5, 25, 43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.202', '0.3279', '1.800', '0.1606', '1.799', '0.0964', '7.000', '0.7087', 1, 1, 1, 1, 1726668097.0387325]
VI_after__Init : ['1.202', '0.3278', '1.800', '0.1606', '1.801', '0.0898', '7.000', '0.7077', 1, 1, 1, 1, 1726668105.0200126]
VI_at__the_End : ['1.202', '0.4998', '1.800', '0.1377', '1.799', '0.1079', '7.000', '0.7083', 1, 1, 1, 1, 1726668163.9415731]