TEST_NAME : Wafer
TEST_DATE : 24_09_18-16_34_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-015-009-03 | FUSED_ID : 6359364768403353747
  IC_TEMP :  -50.35 | VDDM : 1122.35 | AUX_INT :   -6.98 | CsaBias :   83.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01693e-03 / 2
  ADC_P0  : -6.98309e-03 ± 2.16326e-02
  ADC_P1  : 7.56046e-03 ± 4.91961e-04
  ADC_P2  : -4.11143e-06 ± 2.21634e-06
  CSA_Chi2/NDF : 7.45659e-05 / 2
  CSA_P0  : 5.82189e-02 ± 5.75960e-03
  CSA_P1  : 9.22197e-03 ± 4.33944e-04
  CSA_P2  : -3.70301e-05 ± 6.60846e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3259', '1.800', '0.1467', '1.800', '0.0883', '7.000', '0.7075', 1, 1, 1, 1, 1726670052.4691525]
VI_after__Init : ['1.201', '0.3262', '1.800', '0.1467', '1.801', '0.0827', '7.000', '0.7075', 1, 1, 1, 1, 1726670060.494559]
VI_at__the_End : ['1.202', '0.4892', '1.800', '0.1352', '1.799', '0.1115', '7.000', '0.7083', 1, 1, 1, 1, 1726670117.8011234]