TEST_NAME : Wafer
TEST_DATE : 24_09_18-16_14_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-015-021-04 | FUSED_ID : 6359364768403353940
  IC_TEMP :  -53.99 | VDDM : 1132.59 | AUX_INT :   -9.15 | CsaBias :   86.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.42130e-03 / 2
  ADC_P0  : -9.14610e-03 ± 2.55635e-02
  ADC_P1  : 7.99297e-03 ± 5.98934e-04
  ADC_P2  : -5.10855e-06 ± 2.79303e-06
  CSA_Chi2/NDF : 7.33342e-05 / 2
  CSA_P0  : 5.78835e-02 ± 5.71184e-03
  CSA_P1  : 9.34154e-03 ± 4.30346e-04
  CSA_P2  : -3.72596e-05 ± 6.55365e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [54, 68, 73]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.1436', '1.800', '0.1272', '1.799', '0.0838', '7.000', '0.7079', 1, 1, 1, 1, 1726668879.52925]
VI_after__Init : ['1.202', '0.1436', '1.800', '0.1271', '1.800', '0.0770', '7.000', '0.7069', 1, 1, 1, 1, 1726668887.5346231]
VI_at__the_End : ['1.202', '0.4935', '1.800', '0.1338', '1.804', '0.1117', '7.000', '0.7076', 1, 1, 1, 1, 1726668948.909878]