TEST_NAME : Wafer
TEST_DATE : 24_09_18-16_13_02
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-015-022-04 | FUSED_ID : 6359364768403353956
  IC_TEMP :  -52.05 | VDDM : 1131.74 | AUX_INT :   -6.87 | CsaBias :   78.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35625e-03 / 2
  ADC_P0  : -6.87200e-03 ± 2.50285e-02
  ADC_P1  : 7.85363e-03 ± 5.94791e-04
  ADC_P2  : -4.35569e-06 ± 2.79294e-06
  CSA_Chi2/NDF : 8.99318e-05 / 2
  CSA_P0  : 5.89431e-02 ± 6.32527e-03
  CSA_P1  : 9.87420e-03 ± 4.76563e-04
  CSA_P2  : -4.29516e-05 ± 7.25750e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1922', '1.800', '0.1197', '1.799', '0.0900', '7.000', '0.7071', 1, 1, 1, 1, 1726668782.2608287]
VI_after__Init : ['1.202', '0.1922', '1.800', '0.1198', '1.800', '0.0845', '7.000', '0.7069', 1, 1, 1, 1, 1726668790.3382125]
VI_at__the_End : ['1.201', '0.5078', '1.800', '0.1369', '1.801', '0.1102', '7.000', '0.7078', 1, 1, 1, 1, 1726668848.7097068]