TEST_NAME : Wafer
TEST_DATE : 24_09_18-16_47_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-016-008-11 | FUSED_ID : 6359364768403357835
  IC_TEMP :  -52.61 | VDDM : 1121.50 | AUX_INT :   -9.68 | CsaBias :   81.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.78291e-03 / 2
  ADC_P0  : -9.68212e-03 ± 2.86645e-02
  ADC_P1  : 8.36773e-03 ± 6.99249e-04
  ADC_P2  : -5.80445e-06 ± 3.38875e-06
  CSA_Chi2/NDF : 8.35039e-05 / 2
  CSA_P0  : 5.95608e-02 ± 6.09503e-03
  CSA_P1  : 9.27369e-03 ± 4.59216e-04
  CSA_P2  : -3.76170e-05 ± 6.99332e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2561', '1.800', '0.1359', '1.800', '0.0894', '7.000', '0.7079', 1, 1, 1, 1, 1726670833.0224042]
VI_after__Init : ['1.201', '0.2561', '1.800', '0.1359', '1.800', '0.0838', '7.000', '0.7078', 1, 1, 1, 1, 1726670841.105841]
VI_at__the_End : ['1.201', '0.4912', '1.800', '0.1381', '1.803', '0.1107', '7.000', '0.7087', 1, 1, 1, 1, 1726670898.2275338]