TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_00_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-016-016-12 | FUSED_ID : 6359364768403357964
  IC_TEMP :  -54.46 | VDDM : 1126.46 | AUX_INT :   -7.43 | CsaBias :   92.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.78802e-04 / 2
  ADC_P0  : -7.42670e-03 ± 2.11648e-02
  ADC_P1  : 7.74809e-03 ± 4.80325e-04
  ADC_P2  : -5.08628e-06 ± 2.15600e-06
  CSA_Chi2/NDF : 8.39362e-05 / 2
  CSA_P0  : 5.84937e-02 ± 6.11079e-03
  CSA_P1  : 9.44423e-03 ± 4.60404e-04
  CSA_P2  : -3.91634e-05 ± 7.01140e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4169', '1.800', '0.1295', '1.800', '0.0901', '7.000', '0.7083', 1, 1, 1, 1, 1726671607.4499018]
VI_after__Init : ['1.200', '0.4172', '1.800', '0.1296', '1.801', '0.0882', '7.000', '0.7080', 1, 1, 1, 1, 1726671615.5972443]
VI_at__the_End : ['1.201', '0.4966', '1.800', '0.1328', '1.803', '0.1116', '7.000', '0.7086', 1, 1, 1, 1, 1726671673.2608733]