TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_03_23
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-016-018-12 | FUSED_ID : 6359364768403357996
  IC_TEMP :  -51.59 | VDDM : 1122.87 | AUX_INT :  -10.08 | CsaBias :   91.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53726e-03 / 2
  ADC_P0  : -1.00811e-02 ± 2.65661e-02
  ADC_P1  : 7.89786e-03 ± 6.09135e-04
  ADC_P2  : -5.10584e-06 ± 2.78897e-06
  CSA_Chi2/NDF : 6.93215e-05 / 2
  CSA_P0  : 5.70208e-02 ± 5.55336e-03
  CSA_P1  : 9.25415e-03 ± 4.18406e-04
  CSA_P2  : -3.55770e-05 ± 6.37183e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [17]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4092', '1.800', '0.1490', '1.799', '0.0912', '7.000', '0.7079', 1, 1, 1, 1, 1726671803.021939]
VI_after__Init : ['1.202', '0.4095', '1.800', '0.1491', '1.801', '0.0861', '7.000', '0.7079', 1, 1, 1, 1, 1726671811.036347]
VI_at__the_End : ['1.202', '0.4954', '1.800', '0.1342', '1.804', '0.1103', '7.000', '0.7084', 1, 1, 1, 1, 1726671872.4277303]