TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_35_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-017-008-06 | FUSED_ID : 6359364768403361926
  IC_TEMP :  -51.14 | VDDM : 1127.01 | AUX_INT :   -8.52 | CsaBias :   81.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27071e-03 / 2
  ADC_P0  : -8.51743e-03 ± 2.41455e-02
  ADC_P1  : 8.25585e-03 ± 5.81898e-04
  ADC_P2  : -5.72911e-06 ± 2.78141e-06
  CSA_Chi2/NDF : 1.04062e-04 / 2
  CSA_P0  : 5.81096e-02 ± 6.80405e-03
  CSA_P1  : 9.50380e-03 ± 5.12636e-04
  CSA_P2  : -3.81110e-05 ± 7.80684e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [19]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3129', '1.800', '0.1659', '1.799', '0.0881', '7.000', '0.7076', 1, 1, 1, 1, 1726673754.3069797]
VI_after__Init : ['1.202', '0.3131', '1.800', '0.1658', '1.800', '0.0823', '7.000', '0.7074', 1, 1, 1, 1, 1726673762.2573552]
VI_at__the_End : ['1.201', '0.5004', '1.800', '0.1384', '1.799', '0.1107', '7.000', '0.7086', 1, 1, 1, 1, 1726673820.6468325]