TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_19_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-017-018-01 | FUSED_ID : 6359364768403362081
  IC_TEMP :  -29.48 | VDDM : 1150.45 | AUX_INT :   -3.03 | CsaBias :  155.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.13030e-04 / 2
  ADC_P0  : -3.02565e-03 ± 1.53200e-02
  ADC_P1  : 7.30780e-03 ± 3.42669e-04
  ADC_P2  : -3.90020e-06 ± 1.50082e-06
  CSA_Chi2/NDF : 1.04690e-05 / 2
  CSA_P0  : 5.96478e-02 ± 2.15812e-03
  CSA_P1  : 4.74932e-03 ± 1.62599e-04
  CSA_P2  : 1.00877e-06 ± 2.47619e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [40]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1808', '1.800', '0.1627', '1.800', '0.0817', '7.000', '0.7069', 1, 1, 1, 1, 1726672780.0616338]
VI_after__Init : ['1.201', '0.1810', '1.800', '0.1625', '1.800', '0.0760', '7.000', '0.7069', 1, 1, 1, 1, 1726672788.139982]
VI_at__the_End : ['1.201', '0.3616', '1.800', '0.1348', '1.800', '0.1029', '7.000', '0.7077', 1, 1, 1, 1, 1726672847.7033722]