TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_40_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-018-010-08 | FUSED_ID : 6359364768403366056
  IC_TEMP :  -52.93 | VDDM : 1124.77 | AUX_INT :   -8.75 | CsaBias :   81.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52602e-03 / 2
  ADC_P0  : -8.74738e-03 ± 2.64916e-02
  ADC_P1  : 8.30521e-03 ± 6.41980e-04
  ADC_P2  : -5.86003e-06 ± 3.07978e-06
  CSA_Chi2/NDF : 8.96714e-05 / 2
  CSA_P0  : 5.63743e-02 ± 6.31611e-03
  CSA_P1  : 9.39883e-03 ± 4.75873e-04
  CSA_P2  : -3.70827e-05 ± 7.24698e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [35]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [30]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5016', '1.800', '0.1424', '1.799', '0.1010', '7.000', '0.7085', 1, 1, 1, 1, 1726674047.0893376]
VI_after__Init : ['1.201', '0.5023', '1.800', '0.1425', '1.801', '0.0927', '7.000', '0.7076', 1, 1, 1, 1, 1726674055.034692]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1376', '1.799', '0.1109', '7.000', '0.7086', 1, 1, 1, 1, 1726674109.890482]