TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_42_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-018-011-08 | FUSED_ID : 6359364768403366072
  IC_TEMP :  -47.67 | VDDM : 1123.81 | AUX_INT :   -8.45 | CsaBias :   84.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19042e-03 / 2
  ADC_P0  : -8.45443e-03 ± 2.33641e-02
  ADC_P1  : 7.80891e-03 ± 5.33515e-04
  ADC_P2  : -5.05950e-06 ± 2.41753e-06
  CSA_Chi2/NDF : 8.86701e-05 / 2
  CSA_P0  : 6.01711e-02 ± 6.28074e-03
  CSA_P1  : 9.38674e-03 ± 4.73209e-04
  CSA_P2  : -3.69717e-05 ± 7.20641e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [26]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2677', '1.800', '0.1492', '1.799', '0.0835', '7.000', '0.7077', 1, 1, 1, 1, 1726674144.8176994]
VI_after__Init : ['1.201', '0.2677', '1.800', '0.1492', '1.799', '0.0776', '7.000', '0.7076', 1, 1, 1, 1, 1726674152.7782226]
VI_at__the_End : ['1.201', '0.5028', '1.800', '0.1376', '1.799', '0.1103', '7.000', '0.7086', 1, 1, 1, 1, 1726674210.1327436]