TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_50_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-018-016-15 | FUSED_ID : 6359364768403366159
  IC_TEMP :  -51.09 | VDDM : 1129.66 | AUX_INT :   -7.23 | CsaBias :   78.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.04506e-03 / 2
  ADC_P0  : -7.22843e-03 ± 2.19360e-02
  ADC_P1  : 7.83244e-03 ± 5.17618e-04
  ADC_P2  : -4.29065e-06 ± 2.42464e-06
  CSA_Chi2/NDF : 1.38996e-04 / 2
  CSA_P0  : 5.99609e-02 ± 7.86362e-03
  CSA_P1  : 1.01111e-02 ± 5.92467e-04
  CSA_P2  : -4.56332e-05 ± 9.02258e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1464', '1.800', '0.1366', '1.799', '0.0803', '7.000', '0.7076', 1, 1, 1, 1, 1726674624.7060838]
VI_after__Init : ['1.202', '0.1464', '1.800', '0.1366', '1.801', '0.0747', '7.000', '0.7076', 1, 1, 1, 1, 1726674632.6206164]
VI_at__the_End : ['1.201', '0.5125', '1.800', '0.1373', '1.803', '0.1109', '7.000', '0.7086', 1, 1, 1, 1, 1726674689.7353182]