TEST_NAME : Wafer
TEST_DATE : 24_09_18-17_56_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-029-018-020-15 | FUSED_ID : 6359364768403366223
  IC_TEMP :  -61.36 | VDDM : 1109.43 | AUX_INT :   -8.88 | CsaBias :   70.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26786e-03 / 2
  ADC_P0  : -8.87801e-03 ± 2.41025e-02
  ADC_P1  : 7.98264e-03 ± 5.58264e-04
  ADC_P2  : -5.47543e-06 ± 2.56670e-06
  CSA_Chi2/NDF : 1.50587e-04 / 2
  CSA_P0  : 5.81668e-02 ± 8.18496e-03
  CSA_P1  : 9.72148e-03 ± 6.16678e-04
  CSA_P2  : -4.41744e-05 ± 9.39127e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [13]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [35]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0735', '1.800', '0.1308', '1.799', '0.0782', '7.000', '0.7080', 1, 1, 1, 1, 1726675015.0770814]
VI_after__Init : ['1.202', '0.0735', '1.800', '0.1312', '1.800', '0.0733', '7.000', '0.7078', 1, 1, 1, 1, 1726675023.0894964]
VI_at__the_End : ['1.202', '0.4907', '1.800', '0.1377', '1.801', '0.1132', '7.000', '0.7087', 1, 1, 1, 1, 1726675079.8372126]