TEST_NAME : Wafer
TEST_DATE : 24_09_23-16_31_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-002-018-10 | FUSED_ID : 6359364768405397802
  IC_TEMP :  -95.48 | VDDM : 1077.65 | AUX_INT :   -8.44 | CsaBias :   28.40
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.79719e-03 / 2
  ADC_P0  : -8.44318e-03 ± 3.58647e-02
  ADC_P1  : 9.24046e-03 ± 9.54901e-04
  ADC_P2  : -7.24972e-06 ± 5.13976e-06
  CSA_Chi2/NDF : 9.74709e-05 / 2
  CSA_P0  : 5.53251e-02 ± 6.58506e-03
  CSA_P1  : 1.04991e-02 ± 4.96137e-04
  CSA_P2  : -8.09729e-05 ± 7.55558e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [7]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2960', '1.800', '0.1690', '1.800', '0.1000', '7.000', '0.7070', 1, 1, 1, 1, 1727101888.035815]
VI_after__Init : ['1.201', '0.2960', '1.800', '0.1693', '1.800', '0.0947', '7.000', '0.7071', 1, 1, 1, 1, 1727101895.9483008]
VI_at__the_End : ['1.201', '0.3910', '1.800', '0.1329', '1.800', '0.1205', '7.000', '0.7076', 1, 1, 1, 1, 1727101960.073779]