TEST_NAME : Wafer
TEST_DATE : 24_09_23-16_33_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-002-019-10 | FUSED_ID : 6359364768405397818
  IC_TEMP : -129.51 | VDDM : 1098.52 | AUX_INT :  -17.96 | CsaBias :   31.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 5.15259e-03 / 2
  ADC_P0  : -1.79615e-02 ± 4.89208e-02
  ADC_P1  : 9.88639e-03 ± 1.38128e-03
  ADC_P2  : -6.57964e-06 ± 8.03788e-06
  CSA_Chi2/NDF : 1.19757e-04 / 2
  CSA_P0  : 5.89239e-02 ± 7.29915e-03
  CSA_P1  : 1.06252e-02 ± 5.49938e-04
  CSA_P2  : -9.30138e-05 ± 8.37491e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3624', '1.800', '0.1358', '1.800', '0.1024', '7.000', '0.7069', 1, 1, 1, 1, 1727101986.1957624]
VI_after__Init : ['1.202', '0.3571', '1.800', '0.1355', '1.799', '0.0957', '7.000', '0.7070', 1, 1, 1, 1, 1727101994.6632764]
VI_at__the_End : ['1.201', '0.3621', '1.800', '0.1311', '1.802', '0.1133', '7.000', '0.7074', 1, 1, 1, 1, 1727102058.2696602]