TEST_NAME : Wafer
TEST_DATE : 24_09_23-16_57_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-003-008-00 | FUSED_ID : 6359364768405401728
  IC_TEMP : -101.29 | VDDM : 1107.68 | AUX_INT :  -11.78 | CsaBias :   26.15
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.06744e-03 / 2
  ADC_P0  : -1.17840e-02 ± 3.08235e-02
  ADC_P1  : 9.51358e-03 ± 8.37422e-04
  ADC_P2  : -7.82441e-06 ± 4.55595e-06
  CSA_Chi2/NDF : 1.40372e-04 / 2
  CSA_P0  : 5.63597e-02 ± 7.90246e-03
  CSA_P1  : 1.00422e-02 ± 5.95393e-04
  CSA_P2  : -7.18536e-05 ± 9.06713e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2112', '1.800', '0.1835', '1.800', '0.0967', '7.000', '0.7080', 1, 1, 1, 1, 1727103444.2524722]
VI_after__Init : ['1.202', '0.2114', '1.800', '0.1835', '1.800', '0.0907', '7.000', '0.7078', 1, 1, 1, 1, 1727103452.9838028]
VI_at__the_End : ['1.202', '0.3994', '1.800', '0.1332', '1.800', '0.1187', '7.000', '0.7086', 1, 1, 1, 1, 1727103520.2675326]