TEST_NAME : Wafer
TEST_DATE : 24_09_23-16_54_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-003-010-00 | FUSED_ID : 6359364768405401760
  IC_TEMP :  -96.75 | VDDM : 1100.78 | AUX_INT :  -14.59 | CsaBias :   51.00
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.26111e-03 / 2
  ADC_P0  : -1.45917e-02 ± 3.87750e-02
  ADC_P1  : 9.42741e-03 ± 1.01882e-03
  ADC_P2  : -8.23659e-06 ± 5.38282e-06
  CSA_Chi2/NDF : 1.51912e-04 / 2
  CSA_P0  : 5.58693e-02 ± 8.22087e-03
  CSA_P1  : 9.80928e-03 ± 6.19383e-04
  CSA_P2  : -6.71946e-05 ± 9.43248e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [23, 53, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1590', '1.800', '0.1269', '1.800', '0.0854', '7.000', '0.7076', 1, 1, 1, 1, 1727103249.5785244]
VI_after__Init : ['1.202', '0.1594', '1.800', '0.1258', '1.799', '0.0796', '7.000', '0.7078', 1, 1, 1, 1, 1727103257.7029538]
VI_at__the_End : ['1.201', '0.4046', '1.800', '0.1320', '1.800', '0.1212', '7.000', '0.7086', 1, 1, 1, 1, 1727103324.3317215]