TEST_NAME : Wafer
TEST_DATE : 24_09_23-17_03_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-004-008-08 | FUSED_ID : 6359364768405405832
  IC_TEMP :  -90.79 | VDDM : 1105.95 | AUX_INT :  -11.57 | CsaBias :   34.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.95649e-03 / 2
  ADC_P0  : -1.15725e-02 ± 2.99524e-02
  ADC_P1  : 9.16592e-03 ± 7.75588e-04
  ADC_P2  : -7.73845e-06 ± 4.01316e-06
  CSA_Chi2/NDF : 1.57025e-04 / 2
  CSA_P0  : 5.76078e-02 ± 8.35809e-03
  CSA_P1  : 9.84414e-03 ± 6.29722e-04
  CSA_P2  : -6.42205e-05 ± 9.58992e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [51, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1964', '1.800', '0.1587', '1.800', '0.0926', '7.000', '0.7080', 1, 1, 1, 1, 1727103835.871686]
VI_after__Init : ['1.202', '0.1964', '1.800', '0.1585', '1.800', '0.0867', '7.000', '0.7079', 1, 1, 1, 1, 1727103843.9670768]
VI_at__the_End : ['1.202', '0.4198', '1.800', '0.1342', '1.800', '0.1199', '7.000', '0.7085', 1, 1, 1, 1, 1727103905.8050907]