TEST_NAME : Wafer
TEST_DATE : 24_09_23-17_10_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-004-012-08 | FUSED_ID : 6359364768405405896
  IC_TEMP :  -86.95 | VDDM : 1111.62 | AUX_INT :  -12.13 | CsaBias :   59.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.47626e-03 / 2
  ADC_P0  : -1.21315e-02 ± 3.37796e-02
  ADC_P1  : 9.06728e-03 ± 8.69337e-04
  ADC_P2  : -7.43208e-06 ± 4.46511e-06
  CSA_Chi2/NDF : 1.70856e-04 / 2
  CSA_P0  : 5.78953e-02 ± 8.71842e-03
  CSA_P1  : 9.91869e-03 ± 6.56870e-04
  CSA_P2  : -6.41267e-05 ± 1.00034e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2949', '1.800', '0.1606', '1.800', '0.0976', '7.000', '0.7079', 1, 1, 1, 1, 1727104226.7795546]
VI_after__Init : ['1.202', '0.2950', '1.800', '0.1615', '1.800', '0.0905', '7.000', '0.7080', 1, 1, 1, 1, 1727104235.0180314]
VI_at__the_End : ['1.202', '0.4218', '1.800', '0.1344', '1.800', '0.1154', '7.000', '0.7084', 1, 1, 1, 1, 1727104302.6126812]