TEST_NAME : Wafer
TEST_DATE : 24_09_23-17_25_08
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-031-004-021-15 | FUSED_ID : 6359364768405406047
  IC_TEMP :  -89.02 | VDDM : 1110.81 | AUX_INT :  -13.15 | CsaBias :   50.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.63994e-03 / 2
  ADC_P0  : -1.31534e-02 ± 3.48733e-02
  ADC_P1  : 9.09809e-03 ± 8.98258e-04
  ADC_P2  : -7.28051e-06 ± 4.64486e-06
  CSA_Chi2/NDF : 1.68999e-04 / 2
  CSA_P0  : 5.74089e-02 ± 8.67090e-03
  CSA_P1  : 1.04349e-02 ± 6.53290e-04
  CSA_P2  : -7.11239e-05 ± 9.94883e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [8]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [55, 58]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3680', '1.800', '0.1383', '1.800', '0.1058', '7.000', '0.7069', 1, 1, 1, 1, 1727105107.5564263]
VI_after__Init : ['1.202', '0.3697', '1.800', '0.1384', '1.800', '0.0999', '7.000', '0.7071', 1, 1, 1, 1, 1727105116.2527308]
VI_at__the_End : ['1.202', '0.4281', '1.800', '0.1349', '1.800', '0.1191', '7.000', '0.7076', 1, 1, 1, 1, 1727105177.998841]